DIAZ, L.; ZEA, H.; SANCHEZ, F. Photo-electronic Measurement of Film Thickness for the Sulphonation of Methyl Esters in Falling Film Reactors. Asian Journal of Applied Sciences, [S. l.], v. 2, n. 5, 2014. Disponível em: https://ajouronline.com/index.php/AJAS/article/view/952. Acesso em: 25 apr. 2024.